Part I covers all ordinary ray-tracing methods, together with the complete theory of primary aberrations and as much of higher aberration as is needed for the design of telescopes, low-power microscopes and simple optical systems. Chapters: Fundamental Equations, Spherical Aberration, Physical Aspect of Optical Images, Chromatic Aberration, Design of Achromatic Object-Glasses, The Optical Sine Theorem, Trigonometric Tracing of Oblique Pencils, General Theory of Perfect Optical Systems, and Ordinary Eyepieces. Part II extends the coverage to the systematic study and design of practically all types of optical systems, with special attention to high-power microscope objectives and anastigmatic photographic objectives. Edited and completed from the author s manuscript by Rudolf Kingslake, Director of Optical Design, Eastman Kodak Company. Chapters: Additional Solutions by the Thin-Lens Method , Optical Path Differences, Optical Path Differences at an Axiallmage Point, Optical Tolerances, Chromatic Aberration as an Optical Path Difference, The Matching Principle and the Design of Microscope Objectives, Primary Aberrations of Oblique Pencils, Analytical Solutions for Simple Systems with Remote Stop, Symmetrical Photographic Objectives, and Unsymmetrical Photographic Objectives.
